Focused Helium Ion Beam

Estimation of Focused Helium Ion Beam Josephson Junction Width

Ion irradiation has been used to etch or ulter the materials depending on the ion sources and the acceleration energies. High-energy helium ions modify the material properties without any removal. A focused helium ion beam can create a narrow and high-potentiaal barrier for Josephson junctions based on high-temperature cuprate superconductors. My work has demonstrated a simulation result for the barrier dimension, disordered level and stopping depth of ions with support of transport data.